Computer Engineering and Design (CED)

• Optical monitoring and automatic classification of flying insects (NSF)
• Portable medical data telemetry with Bluetooth wireless link and embedded PIC microcontroller
• Heterodyne Optical Tomography (NIH)
• Visual stimulator for electroretinography (Casey Eye Institute OHSU)

John Lynch

• System-on-chip design and verification for FPGAs and ASICs
• Asynchronous and self-timed logic circuits and systems
• Fault-tolerant logic design
• Hardware description and verification languages

8/2004 through now:
Quality and Reliability Sr. Engineer Intel Corporation, Technology Division, Hillsboro, OR
Developed and implemented design reliability verification methodologies for analog circuits and standard cells libraries. Pioneered the methods for electromigration, ESD, device aging (BTI) checks on 32nm technology node.

1/2004 through present
Adjunct Professor, OGI School of Science & Engineering (OHSU), Beaverton, OR
Developed and delivered class “Physical Design and Verification” for graduate EE students.